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CY3437 Gold-plated Silicon Wafer (Au/Cr Coated SiO2/Si Substrate)

Catalog No. CY3437
Compositions Au, Cr, SiO2, Si
Resistivity <0.005 ohm.cm
Substrate Size 4" diameter +/- 0.5 mm x 0.5 mm
Polishing One side polished
Surface roughness < 10 A RMS

Au/Cr Coated SiO2/Si Substrate can be used in the nano field, scanning electron microscopy (SEM), atomic force microscopy (AFM), and other scanning probe microscope ranging. Stanford Advanced Materials (SAM) has rich experience in manufacturing and supplying high-quality Optical Products.

Related products: Aluminum Film on Silicon Wafer, Au/Ti Coated SiO2/Si Substrate, Pt Coated SiO2/Si Substrate, Ag-plated Silicon Wafer

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